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Electrical Atomic Force Microscopy For Nanoelectronics

language: english
Publisher: Springer Nature Switzerland AG, August of 2020 ‧
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The tremendous impact of electronic devices on our lives is the result of continuous improvements of the billions of nanoelectronic components inside integrated circuits (ICs). This book reviews the latest progress in IC devices, with emphasis on the impact of electrical atomic force microscopy (AFM) techniques for their development.

Electrical Atomic Force Microscopy For Nanoelectronics

Property Description
ISBN: 9783030156145
Publisher: Springer Nature Switzerland AG
Release Date: August of 2020
Language: English
Dimensions: 155 x 235 x 20 mm
Cover: Softcover
Pages: 408
Format: Book
Collection: Nanoscience And Technology
Categories: Books in English > Science > Chemical
EAN: 9783030156145

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