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language: english
Publisher: SPRINGER-VERLAG NEW YORK INC., June of 2014 ‧
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This book covers all facets of atom probe microscopyâ€"including field ion microscopy, field desorption microscopy and a strong emphasis on atom probe tomography. Atom Probe Microscopy is aimed at researchers of all experience levels.

Atom Probe Microscopy

by Baptiste Gault, Simon P. Ringer, Julie M. Cairney e Michael P. Moody

Property Description
ISBN: 9781489989390
Publisher: SPRINGER-VERLAG NEW YORK INC.
Release Date: June of 2014
Language: English
Dimensions: 155 x 235 x 20 mm
Cover: Softcover
Pages: 396
Format: Book
Collection: Springer Series In Materials Science
Categories: Books in English > Science > Chemical
EAN: 9781489989390

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