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Advanced Materials Characterization
Basic Principles, Novel Applications, And Future Directions
language: english
Publisher:
TAYLOR & FRANCIS LTD, November of 2024 ‧
see product details
SYNOPSIS
The book covers various methods of characterization of advanced materials commonly used in engineering including understanding of the working principle and applicability of devices. Major instruments covered include X-Ray Diffraction, NSOM Raman, X-Ray Photo Spectroscopy, UV-VIS- NIR Spectrosphotometer, FTIR Spectroscopy, and so forth.
DETAILS
| Property | Description |
|---|---|
| ISBN: | 9781032375113 |
| Publisher: | TAYLOR & FRANCIS LTD |
| Release Date: | November of 2024 |
| Language: | English |
| Dimensions: | 156 x 234 x 20 mm |
| Cover: | Softcover |
| Pages: | 130 |
| Format: | Book |
| Collection: | Advanced Materials Processing And Manufacturing |
| Categories: |
Books in English
>
Science
>
Chemical
Books in English > Others |
| EAN: | 9781032375113 |
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