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Monte Carlo Modeling For Electron Microscopy And Microanalysis eBook

by David C. Joy
language: english
Publisher: Oxford University Press, April of 1995 ‧
143,09€
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This book is a practical guide to the use of Monte Carlo simulation techniques for the study of electron solid interactions in the electron microscope. Programs, optimized for use on personal computers, are developed to deal with typical applications including secondary, and back- scattered, electron imaging. EBIC imaging of semiconductors and X-ray microanalysis.

Monte Carlo Modeling For Electron Microscopy And Microanalysis

by David C. Joy

Property Description
ISBN: 9780195358469
Publisher: Oxford University Press
Release Date: April of 1995
Language: English
Format: eBook
File Format and Compatibility: PDF para ADE
Categories: eBooks in English > Science > Mathematics
EAN: 9780195358469