Capa do artigo Lock-In Thermography
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Lock-In Thermography eBook

Basics And Use For Evaluating Electronic Devices And Materials

by Otwin Breitenstein, Martin C. Schubert e Wilhelm Warta
language: english
Publisher: Springer International Publishing, January of 2019 ‧
184,84€
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Reviewing various experimental approaches to LIT, particularly the commercial LIT systems available, this 3rd edition introduces new LIT applications, such as illuminated LIT applied to solar cells, non-thermal LIT lifetime mapping and LIT application to spin caloritronics problems.

Lock-In Thermography

Basics And Use For Evaluating Electronic Devices And Materials

by Otwin Breitenstein, Martin C. Schubert e Wilhelm Warta

Property Description
ISBN: 9783319998251
Publisher: Springer International Publishing
Release Date: January of 2019
Language: English
Format: eBook
Collection: Springer Series In Advanced Microelectronics
Categories: eBooks in English > Science > Physical
eBooks in English > Engineering > General Engineering
EAN: 9783319998251
Acessibilidade: Ver características de acessibilidade indicadas pelo editor

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