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Lock-In Thermography

Basics And Use For Evaluating Electronic Devices And Materials

by Otwin Breitenstein, Martin C. Schubert e Wilhelm Warta
language: english
Publisher: Springer International Publishing AG, January of 2019 ‧
189,25€
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Reviewing various experimental approaches to LIT, particularly the commercial LIT systems available, this 3rd edition introduces new LIT applications, such as illuminated LIT applied to solar cells, non-thermal LIT lifetime mapping and LIT application to spin caloritronics problems.

Lock-In Thermography

Basics And Use For Evaluating Electronic Devices And Materials

by Otwin Breitenstein, Martin C. Schubert e Wilhelm Warta

Property Description
ISBN: 9783319998244
Publisher: Springer International Publishing AG
Release Date: January of 2019
Language: English
Dimensions: 155 x 235 x 20 mm
Cover: Hardcover
Pages: 321
Format: Book
Collection: Springer Series In Advanced Microelectronics
Categories: Books in English > Engineering > General Engineering
Books in English > Engineering > Mechanical Engineering
EAN: 9783319998244

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