Capa do artigo Lock-In Thermography
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Lock-In Thermography eBook

Basics And Use For Evaluating Electronic Devices And Materials

by Otwin Breitenstein, Martin Langenkamp e Wilhelm Warta
language: english
Publisher: Springer Berlin Heidelberg, September of 2010 ‧
118,59€
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Lock-in Thermography focuses on this sensitive infrared measurement system that offers a more effective analytical capability. Though mainly covering applications in electronic materials and devices, readers will also find treatment of nondestructive evaluation.

Lock-In Thermography

Basics And Use For Evaluating Electronic Devices And Materials

by Otwin Breitenstein, Martin Langenkamp e Wilhelm Warta

Property Description
ISBN: 9783642024177
Publisher: Springer Berlin Heidelberg
Release Date: September of 2010
Language: English
Format: eBook
File Format and Compatibility: PDF para ADE
Collection: Springer Series In Advanced Microelectronics
Categories: eBooks in English > Engineering > General Engineering
eBooks in English > Others
EAN: 9783642024177

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