Capa do artigo Lock-In Thermography
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Lock-In Thermography eBook

Basics And Use For Evaluating Electronic Devices And Materials

by Otwin Breitenstein, Martin Langenkamp e Wilhelm Warta
language: english
Publisher: Springer Berlin Heidelberg, March of 2013 ‧
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Covers lock-in thermography, an analytical method applied to the diagnosis of microelectronic devices. This book reviews various experimental approaches to lock-in thermography, with emphasis on the lock-in IR thermography developed by the authors.

Lock-In Thermography

Basics And Use For Evaluating Electronic Devices And Materials

by Otwin Breitenstein, Martin Langenkamp e Wilhelm Warta

Property Description
ISBN: 9783662083963
Publisher: Springer Berlin Heidelberg
Release Date: March of 2013
Language: English
Format: eBook
File Format and Compatibility: PDF para ADE
Collection: Springer Series In Advanced Microelectronics
Categories: eBooks in English > Engineering > Hydraulic Engineering
eBooks in English > Social Sciences and Humanities > History and Scientific Methodology
eBooks in English > Others
EAN: 9783662083963

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