10% OFF

Helium Ion Microscopy eBook

Name: Helium Ion Microscopy
Price: 59.61 EUR
Author: David C. Joy
ISBN: 9781461486602

Principles And Applications

by David C. Joy

language: english

Publisher: SPRINGER NEW YORK, September of 2013 ‧ see product details

(0)

be the first to comment

59,61€

10% OFF CARD

IMMEDIATE AVAILABILITY

Ebook for ADE

SYNOPSIS

Helium Ion Microscopy: Principles and Applications describes the theory and discusses the practical details of why scanning microscopes using beams of light ions - such as the Helium Ion Microscope (HIM) - are destined to become the imaging tools of choice for the 21st century.

DETAILS

Helium Ion Microscopy

Principles And Applications

by David C. Joy
Property	Description
ISBN:	9781461486602
Publisher:	SPRINGER NEW YORK
Release Date:	September of 2013
Language:	English
Format:	eBook
File Format and Compatibility:	PDF para ADE
Collection:	Springerbriefs In Materials
Categories:	eBooks in English > Science > Chemical
EAN:	9781461486602

BOOKS FROM THE SAME COLLECTION

Reduced Graphene Oxide For Supercapacitor Applications

eBook

10%

Jia Li, Ahmad Azmin Mohamad, Soorathep Kheawhom, Norariza Ahmad, Adil Alshoaibi, (...)

Springer Nature Singapore

53,65€ ~~59,61€~~
Reduced Graphene Oxide For Supercapacitor Applications

10%

Jia Li, Ahmad Azmin Mohamad, Soorathep Kheawhom, Norariza Ahmad, Adil Alshoaibi, (...)

Springer Nature Switzerland AG

54,74€ ~~60,82€~~

free shipping
Enhancing Photocatalytic Water Decontamination

10%

Luis Sanchez, Pierre RamosandJuan Rodriguez

Springer International Publishing AG

48,65€ ~~54,06€~~

free shipping
Biodegradable Iron Implants: Development, Processing, And Applications

10%

T HanasandVp Muhammad Rabeeh

Springer International Publishing AG

54,74€ ~~60,82€~~

free shipping

SEE MORE TITLES FROM THIS COLLECTION

DAVID C. JOY

Scanning Electron Microscopy And X-Ray Microanalysis

10%

Joseph Goldstein, Patrick Echlin, Eric Lifshin, Dale E. Newbury, J.R. Michael, (...)

Springer Science+Business Media

135,18€ 10% CARD

free shipping
Scanning Electron Microscopy And X-Ray Microanalysis

10%

Joseph I. Goldstein, David C. Joy, John Henry J. Scott, Nicholas W.M. Ritchie, Joseph R. Michael, (...)

SPRINGER-VERLAG NEW YORK INC.

135,18€ 10% CARD

free shipping

SEE MORE TITLES BY THIS AUTHOR