Capa do artigo Electrical Atomic Force Microscopy For Nanoelectronics
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Electrical Atomic Force Microscopy For Nanoelectronics eBook

language: english
Publisher: Springer International Publishing, August of 2019 ‧
211,34€
169,07€
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The tremendous impact of electronic devices on our lives is the result of continuous improvements of the billions of nanoelectronic components inside integrated circuits (ICs). This book reviews the latest progress in IC devices, with emphasis on the impact of electrical atomic force microscopy (AFM) techniques for their development.

Electrical Atomic Force Microscopy For Nanoelectronics

Property Description
ISBN: 9783030156121
Publisher: Springer International Publishing
Release Date: August of 2019
Language: English
Format: eBook
Collection: Nanoscience And Technology
Categories: eBooks in English > Science > Physical
eBooks in English > Science > Chemical
EAN: 9783030156121
Acessibilidade: Ver características de acessibilidade indicadas pelo editor

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