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Defect Recognition And Image Processing In Semiconductors 1997 eBook
Proceedings Of The Seventh Conference On Defect Recognition And Image Processing, Berlin, September 1997
language: english
Publisher:
Taylor and Francis Group, November of 2017 ‧
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404,13€
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IMMEDIATE AVAILABILITY
Ebook for ADE
SYNOPSIS
Presents an overview of techniques used to assess, monitor, and characterize defects from the atomic scale to inhomogeneities in complete silicon wafers. This book addresses advances in defect analyzing techniques and instrumentation and their application to substrates, epilayers, and devices. It investigates defects in layers and devices.
DETeBook com proteção para wookreaderILS
| Property | Description |
|---|---|
| ISBN: | 9781351456463 |
| Publisher: | Taylor and Francis Group |
| Release Date: | November of 2017 |
| Language: | English |
| Format: | eBook |
| Collection: | Institute Of Physics Conference Series |
| Categories: |
eBooks in English
>
Science
>
Physical
|
| EAN: | 9781351456463 |
| Acessibilidade: | Ver características de acessibilidade indicadas pelo editor |
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