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Defect Recognition And Image Processing In Semiconductors 1997

Proceedings Of The Seventh Conference On Defect Recognition And Image Processing, Berlin, September 1997

by J. Doneker
language: english
Publisher: TAYLOR & FRANCIS LTD, January of 1998 ‧
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Presents an overview of techniques used to assess, monitor, and characterize defects from the atomic scale to inhomogeneities in complete silicon wafers. This book addresses advances in defect analyzing techniques and instrumentation and their application to substrates, epilayers, and devices. It investigates defects in layers and devices.

Defect Recognition And Image Processing In Semiconductors 1997

Proceedings Of The Seventh Conference On Defect Recognition And Image Processing, Berlin, September 1997

by J. Doneker

Property Description
ISBN: 9780750305006
Publisher: TAYLOR & FRANCIS LTD
Release Date: January of 1998
Language: English
Cover: Hardcover
Pages: 524
Format: Book
Collection: Institute Of Physics Conference Series
Categories: Books in English > Science > Physical
EAN: 9780750305006