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Testing Static Random Access Memories eBook
Defects, Fault Models And Test Patterns
idioma: inglês
Editor:
SPRINGER US, junho de 2013 ‧
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118,59€
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
DISPONIBILIDADE IMEDIATA
Ebook para ADE
SINOPSE
Covers testing of one of the important semiconductor memories types. This book addresses testing of static random access memories (SRAMs), both single-port and multi-port. It introduces description of realistic fault models, based on defect injection and SPICE simulation.
DETALHES
| Propriedade | Descrição |
|---|---|
| ISBN: | 9781475767063 |
| Editor: | SPRINGER US |
| Data de Lançamento: | junho de 2013 |
| Idioma: | Inglês |
| Tipo de produto: | eBook |
| Formato e Compatibilidade: | PDF para ADE |
| Coleção: | Frontiers In Electronic Testing |
| Classificação Temática: |
eBooks em Inglês
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Engenharia
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Eletricidade e Energia
|
| EAN: | 9781475767063 |
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