adicionar à lista de desejos
Testing Static Random Access Memories eBook
Defects, Fault Models And Test Patterns
idioma: inglês
Editor:
SPRINGER US, junho de 2013 ‧
ver detalhes do produto
118,59€
10% DESCONTO
CARTÃO
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
DISPONIBILIDADE IMEDIATA
Ebook para ADE
SINOPSE
Covers testing of one of the important semiconductor memories types. This book addresses testing of static random access memories (SRAMs), both single-port and multi-port. It introduces description of realistic fault models, based on defect injection and SPICE simulation.
DETALHES
| Propriedade | Descrição |
|---|---|
| ISBN: | 9781475767063 |
| Editor: | SPRINGER US |
| Data de Lançamento: | junho de 2013 |
| Idioma: | Inglês |
| Tipo de produto: | eBook |
| Coleção: | Frontiers In Electronic Testing |
| Classificação Temática: |
eBooks em Inglês
>
Engenharia
>
Eletricidade e Energia
|
| EAN: | 9781475767063 |
LIVROS DA MESMA COLEÇÃO
-
10%Timing Performance Of Nanometer Digital Circuits Under Process VariationsSpringer Nature Switzerland AG148,70€ 10% CARTÃOportes grátis
-
eBook10%Timing Performance Of Nanometer Digital Circuits Under Process VariationsSpringer International Publishing145,09€ 10% CARTÃO