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Testing Static Random Access Memories eBook
Defects, Fault Models And Test Patterns
idioma: inglês
Editor:
SPRINGER US, junho de 2013 ‧
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118,59€
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DISPONIBILIDADE IMEDIATA
Ebook para ADE
SINOPSE
Covers testing of one of the important semiconductor memories types. This book addresses testing of static random access memories (SRAMs), both single-port and multi-port. It introduces description of realistic fault models, based on defect injection and SPICE simulation.
DETALHES
| Propriedade | Descrição |
|---|---|
| ISBN: | 9781475767063 |
| Editor: | SPRINGER US |
| Data de Lançamento: | junho de 2013 |
| Idioma: | Inglês |
| Tipo de produto: | eBook |
| Coleção: | Frontiers In Electronic Testing |
| Classificação Temática: |
eBooks em Inglês
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Engenharia
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Eletricidade e Energia
|
| EAN: | 9781475767063 |
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