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Multi-Chip Module Test Strategies eBook
idioma: inglês
Editor:
SPRINGER US, dezembro de 2012 ‧
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118,59€
10% DESCONTO
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
DISPONIBILIDADE IMEDIATA
Ebook para ADE
SINOPSE
This volume of original research is designed for engineers interested in practical implementations of MCM test solutions and for designers looking for leading edge test and design-for-testability solutions for their next designs.
DETALHES
| Propriedade | Descrição |
|---|---|
| ISBN: | 9781461561071 |
| Editor: | SPRINGER US |
| Data de Lançamento: | dezembro de 2012 |
| Idioma: | Inglês |
| Tipo de produto: | eBook |
| Formato e Compatibilidade: | PDF para ADE |
| Coleção: | Frontiers In Electronic Testing |
| Classificação Temática: |
eBooks em Inglês
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Engenharia
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Eletricidade e Energia
|
| EAN: | 9781461561071 |
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