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Introduction To Iddq Testing eBook
idioma: inglês
Editor:
SPRINGER US, dezembro de 2012 ‧
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118,59€
10% DESCONTO
CARTÃO
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
DISPONIBILIDADE IMEDIATA
Ebook para ADE
SINOPSE
This increase in the use of IDDQ testing should be of interest to three groups of individuals associated with the IC business: Product Managers and Test Engineers, CAD Tool Vendors and Circuit Designers.
DETALHES
| Propriedade | Descrição |
|---|---|
| ISBN: | 9781461561378 |
| Editor: | SPRINGER US |
| Data de Lançamento: | dezembro de 2012 |
| Idioma: | Inglês |
| Tipo de produto: | eBook |
| Formato e Compatibilidade: | PDF para ADE |
| Coleção: | Frontiers In Electronic Testing |
| Classificação Temática: |
eBooks em Inglês
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Engenharia
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Eletricidade e Energia
|
| EAN: | 9781461561378 |
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