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Introduction To Advanced System-On-Chip Test Design And Optimization eBook
idioma: inglês
Editor:
SPRINGER US, março de 2006 ‧
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171,59€
10% DESCONTO
CARTÃO
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
DISPONIBILIDADE IMEDIATA
Ebook para ADE
SINOPSE
Testing of Integrated Circuits is important to ensure the production of fault-free chips. This book deals with SOC test design and its optimization. It gives an introduction to testing, describes the problems related to SOC testing, discusses the modeling granularity and the implementation into EDA (electronic design automation) tools.
DETALHES
| Propriedade | Descrição |
|---|---|
| ISBN: | 9780387256245 |
| Editor: | SPRINGER US |
| Data de Lançamento: | março de 2006 |
| Idioma: | Inglês |
| Tipo de produto: | eBook |
| Formato e Compatibilidade: | PDF para ADE |
| Coleção: | Frontiers In Electronic Testing |
| Classificação Temática: |
eBooks em Inglês
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Eletricidade e Energia
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| EAN: | 9780387256245 |
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