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High-Level Estimation And Exploration Of Reliability For Multi-Processor System-On-Chip eBook
idioma: inglês
Editor:
Springer Nature Singapore, junho de 2017 ‧
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118,59€
10% DESCONTO
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DISPONIBILIDADE IMEDIATA
Ebook para ADE
SINOPSE
This book introduces a novel framework for accurately modeling the errors in nanoscale CMOS technology and developing a smooth tool flow at high-level design abstractions to estimate and mitigate the effects of errors.
DETALHES
| Propriedade | Descrição |
|---|---|
| ISBN: | 9789811010736 |
| Editor: | Springer Nature Singapore |
| Data de Lançamento: | junho de 2017 |
| Idioma: | Inglês |
| Tipo de produto: | eBook |
| Formato e Compatibilidade: | PDF para ADE |
| Coleção: | Computer Architecture And Design Methodologies |
| Classificação Temática: |
eBooks em Inglês
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Engenharia
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Eletricidade e Energia
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| EAN: | 9789811010736 |
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