High-Level Estimation And Exploration Of Reliability For Multi-Processor System-On-Chip
idioma: inglês
Editor:
SPRINGER VERLAG, SINGAPORE, maio de 2018 ‧
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SINOPSE
This book introduces a novel framework for accurately modeling the errors in nanoscale CMOS technology and developing a smooth tool flow at high-level design abstractions to estimate and mitigate the effects of errors.
DETALHES
| Propriedade | Descrição |
|---|---|
| ISBN: | 9789811093210 |
| Editor: | SPRINGER VERLAG, SINGAPORE |
| Data de Lançamento: | maio de 2018 |
| Idioma: | Inglês |
| Dimensões: | 155 x 235 x 20 mm |
| Encadernação: | Capa mole |
| Páginas: | 197 |
| Tipo de produto: | Livro |
| Coleção: | Computer Architecture And Design Methodologies |
| Classificação Temática: |
Livros em Inglês
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Engenharia
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Eletricidade e Energia
|
| EAN: | 9789811093210 |
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