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From Contamination To Defects, Faults And Yield Loss eBook
Simulation And Applications
idioma: inglês
Editor:
SPRINGER US, dezembro de 2012 ‧
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118,59€
10% DESCONTO
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DISPONIBILIDADE IMEDIATA
Ebook para ADE
SINOPSE
Given such a high level of investment, it is critical for IC manufacturers to reduce manufacturing costs and get a better return on their investment. The most obvious method of reducing the manufacturing cost per die is to improve manufacturing yield.
DETALHES
| Propriedade | Descrição |
|---|---|
| ISBN: | 9781461313779 |
| Editor: | SPRINGER US |
| Data de Lançamento: | dezembro de 2012 |
| Idioma: | Inglês |
| Tipo de produto: | eBook |
| Formato e Compatibilidade: | PDF para ADE |
| Coleção: | Frontiers In Electronic Testing |
| Classificação Temática: |
eBooks em Inglês
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Eletricidade e Energia
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| EAN: | 9781461313779 |
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