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Design For Testability, Debug And Reliability eBook
Next Generation Measures Using Formal Techniques
idioma: inglês
Editor:
Springer International Publishing, abril de 2021 ‧
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131,84€
10% DESCONTO
CARTÃO
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DISPONIBILIDADE IMEDIATA
Ebook para ADE
SINOPSE
This book introduces several novel approaches to pave the way for the next generation of integrated circuits, which can be successfully and reliably integrated, even in safety-critical applications.
DETALHES
| Propriedade | Descrição |
|---|---|
| ISBN: | 9783030692094 |
| Editor: | Springer International Publishing |
| Data de Lançamento: | abril de 2021 |
| Idioma: | Inglês |
| Tipo de produto: | eBook |
| Formato e Compatibilidade: | |
| Coleção: | Engineering |
| Classificação Temática: |
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| EAN: | 9783030692094 |
| Acessibilidade: | Ver características de acessibilidade indicadas pelo editor |
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