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Design For At-Speed Test, Diagnosis And Measurement eBook
idioma: inglês
Editor:
SPRINGER US, abril de 2006 ‧
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171,59€
10% DESCONTO
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DISPONIBILIDADE IMEDIATA
Ebook para ADE
SINOPSE
Offers practical and proven design-for-testability (DFT) solutions to chip and system design engineers, test engineers and product managers at the silicon level as well as at the board and systems levels. This book contains a complete design flow and analysis of the impact of embedded test on a design.
DETALHES
| Propriedade | Descrição |
|---|---|
| ISBN: | 9780306475443 |
| Editor: | SPRINGER US |
| Data de Lançamento: | abril de 2006 |
| Idioma: | Inglês |
| Tipo de produto: | eBook |
| Formato e Compatibilidade: | PDF para ADE |
| Coleção: | Frontiers In Electronic Testing |
| Classificação Temática: |
eBooks em Inglês
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Engenharia
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Eletricidade e Energia
|
| EAN: | 9780306475443 |
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