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Delay Fault Testing For Vlsi Circuits eBook
idioma: inglês
Editor:
SPRINGER US, dezembro de 2012 ‧
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171,59€
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DISPONIBILIDADE IMEDIATA
Ebook para ADE
SINOPSE
In that sense, this book is the best x DELAY FAULT TESTING FOR VLSI CIRCUITS available guide for an engineer designing or testing VLSI systems. Tech- niques for path delay testing and for use of slower test equipment to test high-speed circuits are of particular interest.
DETALHES
| Propriedade | Descrição |
|---|---|
| ISBN: | 9781461555971 |
| Editor: | SPRINGER US |
| Data de Lançamento: | dezembro de 2012 |
| Idioma: | Inglês |
| Tipo de produto: | eBook |
| Formato e Compatibilidade: | PDF para ADE |
| Coleção: | Frontiers In Electronic Testing |
| Classificação Temática: |
eBooks em Inglês
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Eletricidade e Energia
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| EAN: | 9781461555971 |
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