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Defect Recognition And Image Processing In Semiconductors 1997 eBook
Proceedings Of The Seventh Conference On Defect Recognition And Image Processing, Berlin, September 1997
idioma: inglês
Editor:
Taylor and Francis Group, novembro de 2017 ‧
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404,13€
10% DESCONTO
CARTÃO
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DISPONIBILIDADE IMEDIATA
Ebook para ADE
SINOPSE
Presents an overview of techniques used to assess, monitor, and characterize defects from the atomic scale to inhomogeneities in complete silicon wafers. This book addresses advances in defect analyzing techniques and instrumentation and their application to substrates, epilayers, and devices. It investigates defects in layers and devices.
DETALHES
| Propriedade | Descrição |
|---|---|
| ISBN: | 9781351456463 |
| Editor: | Taylor and Francis Group |
| Data de Lançamento: | novembro de 2017 |
| Idioma: | Inglês |
| Tipo de produto: | eBook |
| Coleção: | Institute Of Physics Conference Series |
| Classificação Temática: |
eBooks em Inglês
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Ciências Exatas e Naturais
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Física
|
| EAN: | 9781351456463 |
| Acessibilidade: | Ver características de acessibilidade indicadas pelo editor |
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