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Defect Recognition And Image Processing In Semiconductors 1997

Proceedings Of The Seventh Conference On Defect Recognition And Image Processing, Berlin, September 1997

de J. Doneker
idioma: inglês
Editor: TAYLOR & FRANCIS LTD, Janeiro de 1998 ‧
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Presents an overview of techniques used to assess, monitor, and characterize defects from the atomic scale to inhomogeneities in complete silicon wafers. This book addresses advances in defect analyzing techniques and instrumentation and their application to substrates, epilayers, and devices. It investigates defects in layers and devices.

Defect Recognition And Image Processing In Semiconductors 1997

Proceedings Of The Seventh Conference On Defect Recognition And Image Processing, Berlin, September 1997

de J. Doneker

Propriedade Descrição
ISBN: 9780750305006
Editor: TAYLOR & FRANCIS LTD
Data de Lançamento: Janeiro de 1998
Idioma: Inglês
Encadernação: Capa dura
Páginas: 524
Tipo de produto: Livro
Coleção: Institute Of Physics Conference Series
Classificação Temática: Livros em Inglês > Ciências Exatas e Naturais > Física
EAN: 9780750305006