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Analog And Mixed-Signal Boundary-Scan eBook
A Guide To The Ieee 1149.4 Test Standard
idioma: inglês
Editor:
SPRINGER US, março de 2013 ‧
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171,59€
10% DESCONTO
CARTÃO
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
DISPONIBILIDADE IMEDIATA
Ebook para ADE
SINOPSE
The Mixed-Signal Boundary-Scan Test Bus is the natural complement to the widely used Boundary-Scan IEEE Standard 1149.1, commonly known as JTAG. This title presents a comprehensive treatment of the design, application and structure of the IEEE 1149.4. It is suitable for researchers and professionals who need to understand IEEE Standard 1149.4.
DETALHES
| Propriedade | Descrição |
|---|---|
| ISBN: | 9781475744996 |
| Editor: | SPRINGER US |
| Data de Lançamento: | março de 2013 |
| Idioma: | Inglês |
| Tipo de produto: | eBook |
| Coleção: | Frontiers In Electronic Testing |
| Classificação Temática: |
eBooks em Inglês
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Eletricidade e Energia
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| EAN: | 9781475744996 |
| Acessibilidade: | Ver características de acessibilidade indicadas pelo editor |
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