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Transmission Electron Microscopy And Diffractometry Of Materials
idioma: inglês
Editor:
SPRINGER-VERLAG BERLIN AND HEIDELBERG GMBH & CO. KG, outubro de 2012 ‧
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148,70€
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SINOPSE
This book explains concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials.
DETALHES
| Propriedade | Descrição |
|---|---|
| ISBN: | 9783642297601 |
| Editor: | SPRINGER-VERLAG BERLIN AND HEIDELBERG GMBH & CO. KG |
| Data de Lançamento: | outubro de 2012 |
| Idioma: | Inglês |
| Encadernação: | Capa dura |
| Páginas: | 764 |
| Tipo de produto: | Livro |
| Coleção: | Graduate Texts In Physics |
| Classificação Temática: |
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| EAN: | 9783642297601 |
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