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Reliability Wearout Mechanisms In Advanced Cmos Technologies
idioma: inglês
Editor:
JOHN WILEY & SONS INC, setembro de 2009 ‧
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221,64€
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SINOPSE
This invaluable resource tells the complete story of failure mechanisms from basic concepts to the tools necessary to conduct reliability tests and analyze the results. Both a text and a reference work for this important area of semiconductor technology, it assumes no reliability education or experience.
DETALHES
| Propriedade | Descrição |
|---|---|
| ISBN: | 9780471731726 |
| Editor: | JOHN WILEY & SONS INC |
| Data de Lançamento: | setembro de 2009 |
| Idioma: | Inglês |
| Encadernação: | Capa dura |
| Páginas: | 640 |
| Tipo de produto: | Livro |
| Coleção: | Ieee Press Series On Microelectronic Systems |
| Classificação Temática: |
Livros em Inglês
>
Engenharia
>
Eletricidade e Energia
|
| EAN: | 9780471731726 |
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