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Optical Scattering
Measurement And Analysis
idioma: inglês
Editor:
SPIE PRESS, setembro de 2025 ‧
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90,04€
10% DESCONTO
IMEDIATO
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SINOPSE
Exploring the link between surface roughness and light scatter, the text connects BRDF and fractional scatter to rapid product inspection. It explains how scatterometry detects semiconductor defects and appearance variations in everyday items, offering practical methods for swift quality control.
DETALHES
| Propriedade | Descrição |
|---|---|
| ISBN: | 9781510690288 |
| Editor: | SPIE PRESS |
| Data de Lançamento: | setembro de 2025 |
| Idioma: | Inglês |
| Encadernação: | Capa mole |
| Páginas: | 368 |
| Tipo de produto: | Livro |
| Coleção: | Press Monographs |
| Classificação Temática: |
Livros em Inglês
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| EAN: | 9781510690288 |
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