Nanometer-Scale Defect Detection Using Polarized Light
idioma: inglês
Editor:
ISTE LTD AND JOHN WILEY & SONS INC, agosto de 2016 ‧
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SINOPSE
This book describes the methods used to detect material defects at the nanoscale. The authors present different theories, polarization states and interactions of light with matter, in particular optical techniques using polarized light.
DETALHES
| Propriedade | Descrição |
|---|---|
| ISBN: | 9781848219366 |
| Editor: | ISTE LTD AND JOHN WILEY & SONS INC |
| Data de Lançamento: | agosto de 2016 |
| Idioma: | Inglês |
| Encadernação: | Capa dura |
| Páginas: | 320 |
| Tipo de produto: | Livro |
| Classificação Temática: |
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| EAN: | 9781848219366 |