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Istfa 2021
Conference Proceedings From The 47th International Symposium For Testing And Failure Analysis
idioma: inglês
Editor:
A S M International, julho de 2022 ‧
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233,87€
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SINOPSE
The theme for the 2021 conference was System-in-Package (SiP) technology. Papers include discussions on board and system level failure analysis; detecting counterfeit microelectronics; emerging failure analysis techniques and concepts; future challenges of failure analysis; and scanning probe analysis.
DETALHES
| Propriedade | Descrição |
|---|---|
| ISBN: | 9781627084192 |
| Editor: | A S M International |
| Data de Lançamento: | julho de 2022 |
| Idioma: | Inglês |
| Encadernação: | Capa mole |
| Páginas: | 461 |
| Tipo de produto: | Livro |
| Classificação Temática: |
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| EAN: | 9781627084192 |
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