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Fifth Size Strain Conference. Diffraction Analysis Of The Microstructure Of Materials
Garmisch-Partenkirchen, October 7-9, 2007
idioma: inglês
Editor:
De Gruyter, outubro de 2015 ‧
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SINOPSE
Presents the complete Proceedings of all contributions to the V Size Strain Conference in Garmisch-Partenkirchen 2007: Lattice Defects Residual Stresses Texture in Thin Films and at Surfaces Line-Broadening Analysis and Line-Profile Fitting Diffraction/Microstructure Modeling.
DETALHES
| Propriedade | Descrição |
|---|---|
| ISBN: | 9783486992557 |
| Editor: | De Gruyter |
| Data de Lançamento: | outubro de 2015 |
| Idioma: | Inglês |
| Dimensões: | 148 x 210 x 20 mm |
| Encadernação: | Capa mole |
| Páginas: | 317 |
| Tipo de produto: | Livro |
| Coleção: | Zeitschrift Fur Kristallographie / Supplemente |
| Classificação Temática: |
Livros em Inglês
>
Ciências Exatas e Naturais
>
Física
|
| EAN: | 9783486992557 |
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