Electromigration Inside Logic Cells
Modeling, Analyzing And Mitigating Signal Electromigration In Nanocmos
idioma: inglês
Editor:
Springer International Publishing AG, julho de 2018 ‧
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SINOPSE
This book describes new and effective methodologies for modeling, analyzing and mitigating cell-internal signal electromigration in nanoCMOS, with significant circuit lifetime improvements and no impact on performance, area and power.
DETALHES
| Propriedade | Descrição |
|---|---|
| ISBN: | 9783319840413 |
| Editor: | Springer International Publishing AG |
| Data de Lançamento: | julho de 2018 |
| Idioma: | Inglês |
| Dimensões: | 156 x 234 x 8 mm |
| Encadernação: | Capa mole |
| Páginas: | 118 |
| Tipo de produto: | Livro |
| Classificação Temática: |
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| EAN: | 9783319840413 |