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Digital Holography For Mems And Microsystem Metrology
idioma: inglês
Editor:
JOHN WILEY & SONS INC, julho de 2011 ‧
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143,23€
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SINOPSE
By taking a practical approach to the industrial inspection of digital holography, Digital Holography for MEMS and Microsystem Metrology offers a description of the use of digital holography and its growing applications for MEMS characterization, residual stress measurement, design and evaluation and device testing and inspection.
DETALHES
| Propriedade | Descrição |
|---|---|
| ISBN: | 9780470978696 |
| Editor: | JOHN WILEY & SONS INC |
| Data de Lançamento: | julho de 2011 |
| Idioma: | Inglês |
| Encadernação: | Capa dura |
| Páginas: | 228 |
| Tipo de produto: | Livro |
| Coleção: | The Wiley Microsystem And Nanotechnology Series |
| Classificação Temática: |
Livros em Inglês
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Engenharia
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Engenharia Geral
Livros em Inglês > Engenharia > Eletricidade e Energia |
| EAN: | 9780470978696 |
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