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Transmission Electron Microscopy And Diffractometry Of Materials

by Brent Fultz e James Howe
language: english
Publisher: SPRINGER-VERLAG BERLIN AND HEIDELBERG GMBH & CO. KG, October of 2012 ‧
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This book explains concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials.

Transmission Electron Microscopy And Diffractometry Of Materials

by Brent Fultz e James Howe

Property Description
ISBN: 9783642297601
Publisher: SPRINGER-VERLAG BERLIN AND HEIDELBERG GMBH & CO. KG
Release Date: October of 2012
Language: English
Cover: Hardcover
Pages: 764
Format: Book
Collection: Graduate Texts In Physics
Categories: Books in English > Others
EAN: 9783642297601

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