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Transmission Electron Microscopy And Diffractometry Of Materials
language: english
Publisher:
SPRINGER-VERLAG BERLIN AND HEIDELBERG GMBH & CO. KG, October of 2012 ‧
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SYNOPSIS
This book explains concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials.
DETAILS
| Property | Description |
|---|---|
| ISBN: | 9783642297601 |
| Publisher: | SPRINGER-VERLAG BERLIN AND HEIDELBERG GMBH & CO. KG |
| Release Date: | October of 2012 |
| Language: | English |
| Cover: | Hardcover |
| Pages: | 764 |
| Format: | Book |
| Collection: | Graduate Texts In Physics |
| Categories: |
Books in English
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Others
|
| EAN: | 9783642297601 |
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