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Total-Reflection X-Ray Fluorescence Analysis And Related Methods

by Alex Von Bohlen e Reinhold Klockenkamper
language: english
Publisher: JOHN WILEY & SONS INC, March of 2015 ‧
162,16€
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Providing an accessible introduction into the use of Total-Reflection X-ray Fluorescence (TXRF) Analysis, both from a theoretical point of view and for practical applications, this new edition of Total-Reflection X-Ray Fluorescence Analysis is completely updated and enlarged to emphasize new methods and techniques.

Total-Reflection X-Ray Fluorescence Analysis And Related Methods

by Alex Von Bohlen e Reinhold Klockenkamper

Property Description
ISBN: 9781118460276
Publisher: JOHN WILEY & SONS INC
Release Date: March of 2015
Language: English
Dimensions: 150 x 250 x 20 mm
Cover: Hardcover
Pages: 552
Format: Book
Collection: Chemical Analysis: A Series Of Monographs On Analytical Chemistry And Its Applications
Categories: Books in English > Science > Chemical
EAN: 9781118460276

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