Terrestrial Radiation Effects In Ulsi Devices And Electronic Systems

by Eishi H. Ibe
language: english
Publisher: JOHN WILEY & SONS INC, February of 2015 ‧
163,51€
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This book provides the reader with knowledge on a wide variety of radiation fields and their effects on the electronic devices and systems. The author covers faults and failures in ULSI devices induced by a wide variety of radiation fields, including electrons, alpha-rays, muons, gamma rays, neutrons and heavy ions.

Terrestrial Radiation Effects In Ulsi Devices And Electronic Systems

by Eishi H. Ibe

Property Description
ISBN: 9781118479292
Publisher: JOHN WILEY & SONS INC
Release Date: February of 2015
Language: English
Cover: Hardcover
Pages: 296
Format: Book
Collection: Wiley-Blackwell Companions To Religion
Categories: Books in English > Science > Physical
EAN: 9781118479292