Techniques And Challenges For 300 Mm Silicon: Processing, Characterization, Modelling And Equipment

Processing, Characterization, Modelling And Equipment

language: english
Publisher: ELSEVIER SCIENCE & TECHNOLOGY, September of 1999 ‧
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Includes papers that cover the E-MRS conference on Techniques and Challenges for 300 mm Silicon: Processing, Characterization, Modeling and Equipment. This book covers a wide range of subjects, financial issues, fab concepts, crystal growth, wafer process development, material and defect issues, and wafer characterization.

Techniques And Challenges For 300 Mm Silicon: Processing, Characterization, Modelling And Equipment

Processing, Characterization, Modelling And Equipment

Property Description
ISBN: 9780080436098
Publisher: ELSEVIER SCIENCE & TECHNOLOGY
Release Date: September of 1999
Language: English
Cover: Hardcover
Pages: 206
Format: Book
Collection: European Materials Research Society Symposia Proceedings
Categories: Books in English > Engineering > Electricity and Energy
EAN: 9780080436098