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language: english
Publisher: JOHN WILEY & SONS INC, September of 2009 ‧
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This invaluable resource tells the complete story of failure mechanisms from basic concepts to the tools necessary to conduct reliability tests and analyze the results. Both a text and a reference work for this important area of semiconductor technology, it assumes no reliability education or experience.

Reliability Wearout Mechanisms In Advanced Cmos Technologies

by Alvin W. (Ibm) Strong, Ernest Y. (Ibm) Wu, Rolf-Peter (Infineon) Vollertsen, Stewart E., Iii Rauch, Giuseppe (Ibm) La Rosa, Timothy D. (Ibm) Sullivan e Jordi (Universitat Autonoma De Barcelona, Spain) Sune

Property Description
ISBN: 9780471731726
Publisher: JOHN WILEY & SONS INC
Release Date: September of 2009
Language: English
Cover: Hardcover
Pages: 640
Format: Book
Collection: Ieee Press Series On Microelectronic Systems
Categories: Books in English > Engineering > Electricity and Energy
EAN: 9780471731726