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Reliability Wearout Mechanisms In Advanced Cmos Technologies
language: english
Publisher:
JOHN WILEY & SONS INC, September of 2009 ‧
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221,64€
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SYNOPSIS
This invaluable resource tells the complete story of failure mechanisms from basic concepts to the tools necessary to conduct reliability tests and analyze the results. Both a text and a reference work for this important area of semiconductor technology, it assumes no reliability education or experience.
DETAILS
| Property | Description |
|---|---|
| ISBN: | 9780471731726 |
| Publisher: | JOHN WILEY & SONS INC |
| Release Date: | September of 2009 |
| Language: | English |
| Cover: | Hardcover |
| Pages: | 640 |
| Format: | Book |
| Collection: | Ieee Press Series On Microelectronic Systems |
| Categories: |
Books in English
>
Engineering
>
Electricity and Energy
|
| EAN: | 9780471731726 |
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