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language: english
Publisher: ISTE LTD AND JOHN WILEY & SONS INC, August of 2016 ‧
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This book describes the methods used to detect material defects at the nanoscale. The authors present different theories, polarization states and interactions of light with matter, in particular optical techniques using polarized light.

Nanometer-Scale Defect Detection Using Polarized Light

by Pierre-Richard (University Of Versailles Saint-Quentin, France) Dahoo, Philippe (Vedecom Institute, Versailles, France) Pougnet e Abdelkhalak (Institut National Des Sciences Appliquees (Insa-Rouen), France) El Hami

Property Description
ISBN: 9781848219366
Publisher: ISTE LTD AND JOHN WILEY & SONS INC
Release Date: August of 2016
Language: English
Cover: Hardcover
Pages: 320
Format: Book
Categories: Books in English > Engineering > General Engineering
Books in English > Others
EAN: 9781848219366