Nanometer-Scale Defect Detection Using Polarized Light
language: english
Publisher:
ISTE LTD AND JOHN WILEY & SONS INC, August of 2016 ‧
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SYNOPSIS
This book describes the methods used to detect material defects at the nanoscale. The authors present different theories, polarization states and interactions of light with matter, in particular optical techniques using polarized light.
DETAILS
| Property | Description |
|---|---|
| ISBN: | 9781848219366 |
| Publisher: | ISTE LTD AND JOHN WILEY & SONS INC |
| Release Date: | August of 2016 |
| Language: | English |
| Cover: | Hardcover |
| Pages: | 320 |
| Format: | Book |
| Categories: |
Books in English
>
Engineering
>
General Engineering
Books in English > Others |
| EAN: | 9781848219366 |