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Multilabel Classification

Problem Analysis, Metrics And Techniques

by Francisco Herrera, Maria J. Del Jesus, Antonio J. Rivera e Francisco Charte
language: english
Publisher: Springer International Publishing AG, August of 2016 ‧
121,66€
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Multilabel Classification

Problem Analysis, Metrics And Techniques

by Francisco Herrera, Maria J. Del Jesus, Antonio J. Rivera e Francisco Charte

Property Description
ISBN: 9783319411101
Publisher: Springer International Publishing AG
Release Date: August of 2016
Language: English
Dimensions: 155 x 235 x 13 mm
Cover: Hardcover
Pages: 194
Format: Book
Categories: Books in English > Computing > Database
EAN: 9783319411101