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Modern Characterization Of Electromagnetic Systems And Its Associated Metrology

by Tapan K. Sarkar, Magdalena (Universidad Politecnica De Madrid, Spain) Salazar-Palma, Heng Chen e Ming Da Zhu
language: english
Publisher: JOHN WILEY & SONS INC, August of 2021 ‧
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Modern Characterization Of Electromagnetic Systems And Its Associated Metrology

by Tapan K. Sarkar, Magdalena (Universidad Politecnica De Madrid, Spain) Salazar-Palma, Heng Chen e Ming Da Zhu

Property Description
ISBN: 9781119076469
Publisher: JOHN WILEY & SONS INC
Release Date: August of 2021
Language: English
Cover: Hardcover
Pages: 720
Format: Book
Collection: Ieee Press
Categories: Books in English > Others
EAN: 9781119076469