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Migration Imaging Of The Transient Electromagnetic Method

by Xiu Li, Changchun Yin e Guoqiang Xue
language: english
Publisher: SPRINGER VERLAG, SINGAPORE, June of 2018 ‧
60,82€
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This book is based on more than a decade of research the authors have pursued on the pseudo-seismic migration imaging of the transient electromagnetic method, and provides a series of important findings on the theory and applications in this area.

Migration Imaging Of The Transient Electromagnetic Method

by Xiu Li, Changchun Yin e Guoqiang Xue

Property Description
ISBN: 9789811096884
Publisher: SPRINGER VERLAG, SINGAPORE
Release Date: June of 2018
Language: English
Dimensions: 156 x 234 x 8 mm
Cover: Softcover
Pages: 139
Format: Book
Categories: Books in English > Science > Physical
Books in English > Others
EAN: 9789811096884