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Microscopy Of Semiconducting Materials

1999 Proceedings Of The Institute Of Physics Conference Held 22-25 March 1999, University Of Oxford, Uk

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language: english
Publisher: TAYLOR & FRANCIS LTD, January of 2000 ‧
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Presents an overview of advances in semiconductor studies using microscopy. This book explores the use of transmission and scanning electron microscopy, ultra fine electron probes, and EELS to investigate semi conducting structures. It is suitable for academics and researchers in materials science, and electrical and electronic engineering.

Microscopy Of Semiconducting Materials

1999 Proceedings Of The Institute Of Physics Conference Held 22-25 March 1999, University Of Oxford, Uk

Property Description
ISBN: 9780750306508
Publisher: TAYLOR & FRANCIS LTD
Release Date: January of 2000
Language: English
Cover: Hardcover
Pages: 772
Format: Book
Collection: Institute Of Physics Conference Series
Categories: Books in English > Social Sciences and Humanities > History and Scientific Methodology
EAN: 9780750306508