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Measurement Techniques For Radio Frequency Nanoelectronics

by Pavel Kabos e T. Mitch Wallis
language: english
Publisher: CAMBRIDGE UNIVERSITY PRESS, September of 2017 ‧
174,39€
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Understand the fundamentals of radio frequency measurement of nanoscale devices with this practical, cross-disciplinary guide. Featuring numerous examples linking theoretical concepts with real-world applications, it is the ideal resource for researchers in both academia and industry new to the field of radio frequency nanoelectronics.

Measurement Techniques For Radio Frequency Nanoelectronics

by Pavel Kabos e T. Mitch Wallis

Property Description
ISBN: 9781107120686
Publisher: CAMBRIDGE UNIVERSITY PRESS
Release Date: September of 2017
Language: English
Dimensions: 174 x 247 x 20 mm
Cover: Hardcover
Pages: 328
Format: Book
Collection: The Cambridge Rf And Microwave Engineering Series
Categories: Books in English > Engineering > Electricity and Energy
Books in English > Others
EAN: 9781107120686

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