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Lifetime Spectroscopy

A Method Of Defect Characterization In Silicon For Photovoltaic Applications

by Stefan Rein
language: english
Publisher: SPRINGER-VERLAG BERLIN AND HEIDELBERG GMBH & CO. KG, June of 2005 ‧
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Lifetime spectroscopy is one of the most sensitive diagnostic tools for the identification and analysis of impurities in semiconductors. This book introduces a transparent modeling procedure that allows a detailed theoretical evaluation of the spectroscopic potential of the different lifetime spectroscopic techniques.

Lifetime Spectroscopy

A Method Of Defect Characterization In Silicon For Photovoltaic Applications

by Stefan Rein

Property Description
ISBN: 9783540253037
Publisher: SPRINGER-VERLAG BERLIN AND HEIDELBERG GMBH & CO. KG
Release Date: June of 2005
Language: English
Dimensions: 155 x 235 x 33 mm
Cover: Hardcover
Pages: 492
Format: Book
Collection: Springer Series In Materials Science
Categories: Books in English > Science > Physical
EAN: 9783540253037

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