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Hf-Based High-K Dielectrics
Process Development, Performance Characterization, And Reliability
language: english
Publisher:
MORGAN & CLAYPOOL PUBLISHERS, October of 2005 ‧
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SYNOPSIS
Chip density and performance have been driven by scaling of semiconductor devices. This book tells how SiO2 gate dielectrics have reached its minimum thickness due to direct tunneling current and reliability concerns. Therefore, high-k dielectrics attracted more attention from industries as the replacement of conventional SiO2 gate dielectrics.
DETAILS
| Property | Description |
|---|---|
| ISBN: | 9781598290042 |
| Publisher: | MORGAN & CLAYPOOL PUBLISHERS |
| Release Date: | October of 2005 |
| Language: | English |
| Cover: | Softcover |
| Pages: | 92 |
| Format: | Book |
| Categories: |
Books in English
>
Engineering
>
Electricity and Energy
|
| EAN: | 9781598290042 |