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Fundamentals Of Crystallography, Powder X-Ray Diffraction, And Transmission Electron Microscopy For Materials Scientists

by Dong (Nanyang Technological University, Singapore) Zhili
language: english
Publisher: TAYLOR & FRANCIS LTD, May of 2022 ‧
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The goal of this textbook is to effectively equip readers with an in-depth understanding of crystallography, x-ray diffraction, and transmission electron microscopy theories as well as applications. It is written as an introduction to the topic with minimal reliance on advanced mathematics.

Fundamentals Of Crystallography, Powder X-Ray Diffraction, And Transmission Electron Microscopy For Materials Scientists

by Dong (Nanyang Technological University, Singapore) Zhili

Property Description
ISBN: 9780367357948
Publisher: TAYLOR & FRANCIS LTD
Release Date: May of 2022
Language: English
Dimensions: 156 x 234 x 20 mm
Cover: Hardcover
Pages: 272
Format: Book
Collection: Advances In Materials Science And Engineering
Categories: Books in English > Science > Geology
Books in English > Social Sciences and Humanities > History and Scientific Methodology
Books in English > Others
EAN: 9780367357948