Electromigration Inside Logic Cells
Modeling, Analyzing And Mitigating Signal Electromigration In Nanocmos
language: english
Publisher:
Springer International Publishing AG, July of 2018 ‧
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SYNOPSIS
This book describes new and effective methodologies for modeling, analyzing and mitigating cell-internal signal electromigration in nanoCMOS, with significant circuit lifetime improvements and no impact on performance, area and power.
DETAILS
| Property | Description |
|---|---|
| ISBN: | 9783319840413 |
| Publisher: | Springer International Publishing AG |
| Release Date: | July of 2018 |
| Language: | English |
| Dimensions: | 156 x 234 x 8 mm |
| Cover: | Softcover |
| Pages: | 118 |
| Format: | Book |
| Categories: |
Books in English
>
Engineering
>
Electricity and Energy
Books in English > Others |
| EAN: | 9783319840413 |