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Electromigration Inside Logic Cells

Modeling, Analyzing And Mitigating Signal Electromigration In Nanocmos

by Ricardo Reis, Gracieli Posser, Sachin S. Sapatnekar e Ricardo Reis
language: english
Publisher: Springer International Publishing AG, July of 2018 ‧
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This book describes new and effective methodologies for modeling, analyzing and mitigating cell-internal signal electromigration in nanoCMOS, with significant circuit lifetime improvements and no impact on performance, area and power.

Electromigration Inside Logic Cells

Modeling, Analyzing And Mitigating Signal Electromigration In Nanocmos

by Ricardo Reis, Gracieli Posser, Sachin S. Sapatnekar e Ricardo Reis

Property Description
ISBN: 9783319840413
Publisher: Springer International Publishing AG
Release Date: July of 2018
Language: English
Dimensions: 156 x 234 x 8 mm
Cover: Softcover
Pages: 118
Format: Book
Categories: Books in English > Engineering > Electricity and Energy
Books in English > Others
EAN: 9783319840413