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Digital Holography For Mems And Microsystem Metrology
language: english
Publisher:
JOHN WILEY & SONS INC, July of 2011 ‧
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SYNOPSIS
By taking a practical approach to the industrial inspection of digital holography, Digital Holography for MEMS and Microsystem Metrology offers a description of the use of digital holography and its growing applications for MEMS characterization, residual stress measurement, design and evaluation and device testing and inspection.
DETAILS
| Property | Description |
|---|---|
| ISBN: | 9780470978696 |
| Publisher: | JOHN WILEY & SONS INC |
| Release Date: | July of 2011 |
| Language: | English |
| Cover: | Hardcover |
| Pages: | 228 |
| Format: | Book |
| Collection: | The Wiley Microsystem And Nanotechnology Series |
| Categories: |
Books in English
>
Engineering
>
General Engineering
Books in English > Engineering > Electricity and Energy |
| EAN: | 9780470978696 |
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