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Digital Holography For Mems And Microsystem Metrology

by Anand (Nanyang Technological University, Singapore) Asundi
language: english
Publisher: JOHN WILEY & SONS INC, July of 2011 ‧
143,23€
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By taking a practical approach to the industrial inspection of digital holography, Digital Holography for MEMS and Microsystem Metrology offers a description of the use of digital holography and its growing applications for MEMS characterization, residual stress measurement, design and evaluation and device testing and inspection.

Digital Holography For Mems And Microsystem Metrology

by Anand (Nanyang Technological University, Singapore) Asundi

Property Description
ISBN: 9780470978696
Publisher: JOHN WILEY & SONS INC
Release Date: July of 2011
Language: English
Cover: Hardcover
Pages: 228
Format: Book
Collection: The Wiley Microsystem And Nanotechnology Series
Categories: Books in English > Engineering > General Engineering
Books in English > Engineering > Electricity and Energy
EAN: 9780470978696

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