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Cluster Secondary Ion Mass Spectrometry

Principles And Applications

by Christine M. Mahoney
language: english
Publisher: JOHN WILEY & SONS INC, June of 2013 ‧
144,59€
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This book describes the importance of the emerging technique Cluster Secondary Ion Mass Spectrometry (SIMS), which is used for the analysis of a range of solid materials, including everything from organic and polymeric materials, to cells and semiconductors.

Cluster Secondary Ion Mass Spectrometry

Principles And Applications

by Christine M. Mahoney

Property Description
ISBN: 9780470886052
Publisher: JOHN WILEY & SONS INC
Release Date: June of 2013
Language: English
Cover: Hardcover
Pages: 380
Format: Book
Collection: Wiley Series On Mass Spectrometry
Categories: Books in English > Science > Chemical
EAN: 9780470886052